TLU in CMOS ICs in the Electrical Fast Transient Test

introduces the TLU under the electrical fast transient (EFT) test. The EFT test is used to demonstrate the immunity of electronic equipment to transient disturbances such as those originating from switching transients. During the EFT test, the EFT generator applies a number of fast pulses, coupled into power supply, control, signal, and ground ports of electronic equipment. Same as the system-level ESD test, TLU can be easily initiated by sweep-back current under the EFT test. Different types of noise filter networks are also investigated to find their effectiveness for improving the TLU immunity against EFT tests.