Analysis of mobile phone's immunity to electrostatic discharge soft failures

A technique for the analysis of mobile phone's immunity to the electrostatic discharge (ESD) soft failures is proposed. First, a mobile phone, ESD simulator and ESD testing setup are modelled and then the simulation is performed using time-domain full-wave electromagnetic simulator. The proposed technique is applied to the analysis of ESD soft failure of mobile phones and the root causes of the ESD soft failure are investigated. ESD voltages obtained from simulation are compared to that from measurement. Also, improvement in the frequency of occurrence of ESD soft failure by the application of countermeasures derived from ESD simulation result is presented.