Design of GLFSR based test processor chip

The key components of all electronic equipment are integrated circuits (ICs). Due to the improvement of integration technology, the complexity of such circuit is increasing rapidly. It has become a challenge to test ICs with reliable performance in respect to storage requirement, test application time and fault coverage. In this paper we investigate the performance of Generalized Linear Feedback Shift Register (GLFSR) based test processor implementing mixed-mode testing technique. It is shown that GLFSR based Test processor performs better in testing of IC.