Time-delay compensation in detection electronics of fast scanning 2D SAW/BAW laser probe

This paper describes the enhancement of the measurement speed by compensating delay time caused in detection electronics. As a demonstration, an SAW field in a one-port resonator was visualised by the developed system. It is shown that under optimal compensation, the influence of the delay time can be dissolved, and that a high quality image is obtained even when the two-way data scan is applied. Compared with the conventional system, the sampling rate was made double.