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A new methodology for evaluation of edge detectors | IEEE Conference Publication | IEEE Xplore

A new methodology for evaluation of edge detectors


Abstract:

This paper defines a new methodology for evaluating edge detectors through measurements on edginess maps instead of on binary edge maps as previous methodologies do. Thes...Show More

Abstract:

This paper defines a new methodology for evaluating edge detectors through measurements on edginess maps instead of on binary edge maps as previous methodologies do. These measurements avoid possible bias introduced by the application-dependent process of generating binary edge maps from edginess maps. The features of completeness, discriminability, precision and robustness, which a general-purpose edge detector must comply with, are introduced. The R, DS, P and FAR-measurements in addition to PSNR applied to the edginess maps are defined to assess the performance of edge detection. The R, DS, P and FAR-measurements can be seen as generalizations of previously proposed measurements on binary edge maps. Well-known and state-of-the-art edge detectors have been compared by means of the new proposed metrics. Results show that it is difficult for an edge detector to comply with all the proposed features.
Date of Conference: 07-10 November 2009
Date Added to IEEE Xplore: 17 February 2010
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Conference Location: Cairo, Egypt

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