Scanning tunneling microscopy | IBM Journals & Magazine | IEEE Xplore

Scanning tunneling microscopy


Abstract:

Presented here is an overview of the present status and future prospects of scanning tunneling microscopy. Topics covered include the physical basis of the scanning tunne...Show More

Abstract:

Presented here is an overview of the present status and future prospects of scanning tunneling microscopy. Topics covered include the physical basis of the scanning tunneling microscope, its instrumentation aspects, and its use for structural and spectroscopic imaging—on a scale which extends to atomic dimensions. Associated experimental and theoretical studies are reviewed, including several which suggest potential applicability of this new type of microscope to a relatively broad range of biological, chemical, and technological areas.
Published in: IBM Journal of Research and Development ( Volume: 44, Issue: 1.2, January 2000)
Page(s): 279 - 293
Date of Publication: January 2000

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