Measurement of material shielding effectiveness using a dual TEM cell and vector network analyzer

This paper deals with material shielding effectiveness (SE) measurements made with a system based on a vector network analyzer (VNA) and a dual TEM cell (DTEM). This system allows the separate measurement of the electric and magnetic SE (within the system dynamic range). A description of the measurement system is given together with a summary of the theory used. The limitations of the measuring system are also analyzed and discussed presenting some sample measurements.