Nonlinear optical pulse propagation in a semiconductor medium in the transient regime. II. Interferometric sampling

For pt.I see ibid., vol.26, no.4, p.760-9 (1990). A numerical model of pulse propagation in a semiconductor is used to simulate the technique of interferometric sampling of the semiconductor response to an optical pulse. Interferometric sampling is a form of time-resolved interferometry which combines elements of classical interferometry and pump-probe techniques to obtain the transient response of nonlinear refractive index and absorption changes in a material. The technique is shown to accurately measure saturated changes in phase and transmittance, as well as the interband recombination time.