High resolution frequency-domain reflectometry

A high-resolution method for the estimation of the position and magnitude of reflections from frequency-domain measurements is presented. The technique can tackle problems where Fourier-transform-based analysis fails. The connection between high-resolution frequency-domain reflectometry (FDR) and the estimation of the parameters of complex sinusoids with known phase is shown. A suitable algorithm is outlined, and its performance is evaluated analytically and through simulation. To demonstrate its practical applicability, the method is tested on vector network analyzer (VNA) measurements of a coaxial transmission line with a nonuniform dielectric.<
>