Reliability of Nondeteriorating Devices

A general theory has been developed for calculating the reliability of a device which does not deteriorate with time and which is exposed to a stochastic load. Two important cases of stochastic loads have been considered: (1) statistically independent random pulses, and (2) a sequence of random pulses, each one separated from the next one by a random period of time during which no load is applied to the device. Numerical examples are included.