Vertical cross-point resistance change memory for ultra-high density non-volatile memory applications | IEEE Conference Publication | IEEE Xplore

Vertical cross-point resistance change memory for ultra-high density non-volatile memory applications


Abstract:

Vertically defined resistance change memory cells for the vertical cross-point architecture (VCPA) as a high density non-volatile memory application are successfully demo...Show More

Abstract:

Vertically defined resistance change memory cells for the vertical cross-point architecture (VCPA) as a high density non-volatile memory application are successfully demonstrated with a NiO switching layer. They showed both unipolar and bipolar switching mode. Several issues in realization for VCPA and their possible solutions are discussed.
Date of Conference: 15-17 June 2009
Date Added to IEEE Xplore: 11 August 2009
Print ISBN:978-1-4244-3308-7

ISSN Information:

Conference Location: Kyoto, Japan

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