Circuital analysis of a coaxial re-entrant cavity for performing dielectric measurement

We apply circuital analysis to the re-entrant cavity method for measuring the relative permittivity and loss tangent of dielectric material. With this new model, we are able to make use of the higher-order resonant modes of the re-entrant cavity, and are therefore able to broaden the frequency range over which we can measure the dielectric properties of the sample. We compare this new model with others in the literature and validate its capabilities through a comparison with other dielectric measurement techniques.