Simplified Procedure for Estimating Epitaxy of ${\rm La}_{2}{\rm Zr}_{2}{\rm O}_{7}$ -Buffered NiW RABITS Using XRD

A procedure is developed for assessing the epitaxy of La
_2-

x
Zr
₂₊

x
O
₇
(LZO) layers on NiW RABITS. Comparing XRD patterns ( thetas -2thetas scans and 2D rocking curves) of LZO films of known thickness (ellipsometry or reflectometry measurements) with those of standard samples (100% epitaxial LZO film and an isotropic LZO pellet of known density), we estimate the epitaxial (
EF
), and polycrystalline (
PF
) fractions of LZO within the layer. The procedure was tested using MOD-LZO(100 nm)/NiW tape samples with
EF
varied from 3 to 90% (reproducibly prepared by varying the humidity of Ar - 5%H
₂
gas during heat treatment). A qualitative agreement with RHEED and quantitative (within plusmn 10%) agreement with the EBSD results was shown. Correlation between EF and
J

_c
in 600 nm thick YBCO layer deposited on MOD-LZO/NiW using thermal coevaporation enables us to impose the
EF
= 80% margin on the quality of LZO layer for the particular conductor architecture.