Abstract:
This paper describes a cost effective self-test mode in a complex mixed-signal device. The device under test (DUT) is a Voice-Coil Motor (VCM) H-bridge amplifier with an ...Show MoreMetadata
Abstract:
This paper describes a cost effective self-test mode in a complex mixed-signal device. The device under test (DUT) is a Voice-Coil Motor (VCM) H-bridge amplifier with an onchip 11-bit D/A converter. The self-test mode can be initiated at the chip, board and system levels of testing and troubleshooting. The added self-test circuitry does not induce any noticeable silicon overhead.
Published in: Proceedings 13th IEEE VLSI Test Symposium
Date of Conference: 30 April 1995 - 03 May 1995
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-8186-7000-2
Print ISSN: 1093-0167
