STDF Memory Fail Datalog Standard

Yield learning in modern technologies requires fail data logging from the scan and memory structural tests to gain insight into the failing location inside a chip.Currently there is no standard format to store the fail data in an efficient way. A group of more than 20companies from ATE, EDA, Semiconductor and Yield Management companies has been working to enhance the Standard Fail Data log Format (STDF) V4 to enable efficient fail data log for scan and memory fails. This paper describes the proposed memory fail datalog format.