Determination of the propagation constant of coupled lines on chips based on high frequency measurements

A new method has been developed to determine the propagation constant of symmetrical coupled lossy lines. The results are based on high frequency measurements of the scattering parameters of only two coupled two line systems of different lengths. The mathematical derivation of the method is be given. The proposed method is related to an eigenvalue calculation. Results obtained from measurements are presented and discussed. A comparison between the measured and calculated results is given and shows excellent agreement.