Measurement of Multiple Optical Parameters of Birefrigent Sample Using Polarization-Sensitive Optical Coherence Tomography

A new polarization-sensitive optical coherence tomography (PS-OCT) system is proposed for obtaining simultaneous measurements of the thickness, mean group refractive index, apparent phase retardation, and optical axis orientation of a linear birefringent material. The proposed PS-OCT system has no need for a high-precision scanning stage or controller and utilizes a thermal light source in order to enhance the resolution in the axial direction. Utilizing the proposed PS-OCT system, a novel technique is proposed for obtaining direct measurements of the group extraordinary and ordinary refractive indexes and group birefringence properties of the linear birefringent sample, and it could be used to inspect and verify the corresponding parameters of a sample. To the best of the authors' knowledge, the system developed in this study is the first system presented in the literature capable of obtaining simultaneous measurements of the multiple optical parameters of a linear birefringent material. As such, the PS-OCT system represents an ideal solution for industrial applications in which a precise knowledge of the optical properties of a birefringent material is required.