Abstract:
Based on the combination of the genetic and Levenberg-Marquardt algorithms, a new method is developed to perform both local and global parameter extraction for the PSP MO...Show MoreMetadata
Abstract:
Based on the combination of the genetic and Levenberg-Marquardt algorithms, a new method is developed to perform both local and global parameter extraction for the PSP MOSFET model. It has been successfully used to extract parameter sets for a 65-nm technology node. Numerical examples demonstrate its ability to obtain highly accurate model parameter values without excessive computational cost.
Date of Conference: 30 March 2009 - 02 April 2009
Date Added to IEEE Xplore: 14 April 2009
Print ISBN:978-1-4244-4259-1
Contents 