An Analysis of Temperature Impact on MOSFET Mismatch | IEEE Conference Publication | IEEE Xplore

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An Analysis of Temperature Impact on MOSFET Mismatch

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S. Mennillo; A. Spessot; L. Vendrame; L. Bortesi
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Abstract:

Summarizing the results collected on several technologies, we have studied the impact of temperature on MOSFET mismatch, highlighting the improvement of current gain matc...Show More

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Abstract:

Summarizing the results collected on several technologies, we have studied the impact of temperature on MOSFET mismatch, highlighting the improvement of current gain matching properties with temperature, suggesting a possible physical explanation to this phenomenon and proposing a BSIM3 model implementation for Monte Carlo mismatch simulations.
Published in: 2009 IEEE International Conference on Microelectronic Test Structures
Date of Conference: 30 March 2009 - 02 April 2009
Date Added to IEEE Xplore: 14 April 2009
Print ISBN:978-1-4244-4259-1

ISSN Information:

DOI: 10.1109/ICMTS.2009.4814610
Conference Location: Oxnard, CA, USA
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