Accurate de-embedding technique for on-chip small-signal characterization of high-frequency optical modulator

A simple and accurate de-embedding technique has been developed for characterizing the microwave circuit behavior of noninsertable multiple quantum well waveguide modulators with on-chip two-port S-parameter measurements. The small signal equivalent circuit parameters extracted from the error corrected modulation response show an excellent agreement with both one-port microwave reflection coefficient measurement and CV data measured at 1 MHz.