Application of Iterative Curve-Fitting Method in Separating Overlapped Peaks of SF6 Decomposed Products

The SF
₆
decomposed products are very alike, so the peaks of the SF
₆
decomposed products are overlapped. It make us hard to quantitative calculate. This paper introduced a method to seperate the overlapped chromatogram peaks with iterative curve-fitting and Gauss function, and deduced the formula of the iterative curve-fitting; provided a method to calculate the initial value of the peaks intensity and width by iterative formula, and confirm the final peaks intensity and width to seperate the overlapped signals. By the analysis of the real chromatogragh data, it proved the validity of this method on the main components used in distinguishing the GIS internal defects. This method overcomes the influence of SF
₆
peak to the other thin concentration peaks, so it can use on the study of the quantitative analysis of the decomposed products on different failures and different voltages.