Characterization of a 2 ${\hbox {Tbit/in}}^{2}$ Patterned Media Recording System

The characteristics of bit patterned media with an areal density of 2 Tbit/in
²
were investigated using micromagnetic simulations. The influence of dot size and position dispersions on the signal-to-noise ratio (SNR) was clarified. The head-medium synchronization tolerance (write margin) for error-free writing was calculated, and the feasibility of achieving 2 Tbit/in
²
recording with bit patterned media was demonstrated.