Control and observation of analog nodes in mixed-signal boards

BST is a well established standard and testability framework for digital ICs and boards. The paper presents a test support IC controlled by an IEEE1149.1 interface, capable of providing access to analog nodes in mixed-signal boards. The proposed architecture (ABSINT - Analog to Boundary Scan Interface) is described and relevant implementation issues are discussed. A demonstrator IC implementing the ABSINT architecture is presented, and it is shown how it can be used to provide analog test channels under control of IEEE1149.1.<
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