I/sub DD/ pulse response testing on analog and digital CMOS circuits

This paper presents a new method for detecting defect and fabrication variations in both digital and analog CMOS circuits by simultaneously pulsing the power supply rails and analyzing the temporal and/or the spectral characteristics of the resulting transient rail currents. The method presented has a distinct advantage over other forms of i/sub DD/ testing because it requires a single test vector to excite and expose the presence of a defect or irregular fabrication process condition. This paper presents data from simulations and defective IC's supporting this technique.<
>