Fault location algorithms for repairable embedded RAMs

This paper shows how to: (1) convert single-bit march tests into multi-bit March tests; and then (2) how to transform the new multi-bit March tests, using a "serial shifting notation" which represents "serial access" in embedded RAMs, into serial-access word-oriented March tests. The standard March test notation is extended to compactly include Galloping read actions, and other algorithms with two levels of FOR-loops, since such algorithms are indispensible for locating coupling faults in cell arrays, and stuck-open faults in address decoders. The main body of the paper uses the new notations to describe seven categories of fault location algorithms, with each algorithm displayed in both the "hybrid serial/parallel" and the "modular" data accessing formats.<
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