Analog Test Technology: Stable and Grounded, or Open Loop and Spurious?

The op-amp test loop used in the 1970s is still in use today. In the early 1980s, Matt Mahoney won best paper and honorable mention awards at this conference for ground breaking work in the area of analog and DSP based testing. While devices have evolved over the years in terms of speed, precision, and integration on SOC chips, almost all of the test techniques created by the early leaders are still in use today.