The Electrical Contact Resistance of Two Rough Surfaces with Varying Phase Conductivity

Electrical contact materials deposited via thin-film processes enable the structuring of interfaces that optimize electrical contact performance. The performance gains are accomplished by structuring the contact material such that a conductive pathway is always present in the composite, a phenomenon related to the percolation threshold. The relationship between film composition and percolation threshold was explored by combined three-dimensional contact area and resistance modeling as well as experimental efforts. An optimal composite structure was found based on deposition parameters and compositional phase selections.