Process capability sensitivity analysis for design evaluation of multi station assembly systems

Yield, i.e. the conformity of quality characteristics, is defined as an evaluation index to represent the process capability of multistation manufacturing systems (MMS). A model based method is developed for the yield sensitivity analysis. The sensitivity indicates the impact of design parameters, such as design nominal, tolerances, and specifications, to the quality conformity of a process. Three algorithms for the sensitivity analysis are developed. A floor pan assembly case study is presented for validation.