Parametrical fault test of CMOS LNA

This paper presents the circuitry to implement a Built-in Self Test (BiST) strategy for a RF receiver. Using this test strategy fault detection is performed on a LNA. The considered faults are parametrical variations of some LNA elements, and soft opens at selected nodes. After simulations we discuss the detectability margin of these faults. As a rule of thumb, the parametrical faults detectability can be checked by setting them to 50% of the nominal value. In order to classify soft opens as detectable or not, they can be substituted by a 100Ω resistance.