X-ray topography of piezoelectric La3Ta0.5Ga5.5O14 crystal grown by Czochralski method

We performed synchrotron X-ray topography on a La
₃
Ta
_0.5
Ga
_5.5
O
₁₄
(LTG) crystal grown by the Czochralski method. Since a synchrotron X-ray source can provide high-energy X-rays, one can detect bulk structures by X-ray topography. LTG is one of the most attractive piezoelectric crystals along with La
₃
Ga
₅
SiO
₁₄
(LGS) because of its excellent acoustic properties (temperature compensation of acoustic losses). Since LTG single crystals can be grown from a stoichiometric melt, it was expected that single crystals with better quality than the LGS crystal, which cannot be grown from a stoichiometric system but only from a congruent melt, can be obtained. However, 60 keV X-ray topography revealed that the LTG crystal quality was not as high as the LGS crystal quality. The crystal quality of the central region was lower than that of the surrounding region.