Development status of a 420–1980 GHz vector network analyzer for time-domain reflectometry and imaging applications

With recent progress in the area of electronically tunable solid-state sources it is possible to fully extend microwave measurement techniques into the THz frequency range. In this paper we present the development status of a 420-1980 GHz vector network analyzer and illustrate how phase-sensitive heterodyne techniques can be used in the area of THz reflectometry and imaging.