Burn-in operations improvement with full automation and OEE/OEU

The ultimate goal in every semiconductor assembly/test manufacturing process is to attain the highest quality standard and process yield. With traditional Process Controls relying on manual inspections and human-dependent process control, the quality and yield goals are very difficult to achieve. With out full knowledge of what is happening in the burn-in process and without data to analyze burn-in operational efficiency, the operational metrics seem impossible to improve. This paper aims to document the works and lessons learned in developing and deploying Burn-in Full Automation and OEE/OEU and impact to Burn-in quality, yield and productivity in Texas Instruments (Philippines) Inc.