Modeling the Electromagnetic Emission of a Microcontroller Using a Single Model

This paper presents a methodology for building an integrated circuit behavioral model that enables the prediction of its electromagnetic (EM) emissions up to several gigahertz. The model, built upon S-parameter characterization and conducted emission measurements, is used to predict the EM emissions of a commercial 16-bit microcontroller. The emission measurements are performed according to several EM compatibility standards, namely, 1 $\Omega$/150 $\Omega$ , surface scan, and transverse EM/gigahertz transverse EM (GTEM) method, and their results show an excellent fit with model predictions.