Temperature dependence of complex permittivity of planar microwave materials

Fabrication of dielectric materials with low losses at microwave frequencies and stable dielectric properties under varying temperatures is an important and challenging area of research. In this paper characterisation of several planar dielectrics at microwave frequencies (~9.5 GHz) in the temperature range from 20 K to 290 K using a split post dielectric resonator has been presented. We have compared temperature stability of measured dielectric properties of RT5880, RT6010, LTCC, FR4 and Ba(Mg
_x
Ta
_y
)O
₃
materials. Presented results are useful for selection of a material suitable for a specific application.