IEEE Draft Standard for Exposed Semiconducting Shields on High Voltage Cable Joints and Separable Connectors

IEEE Standard 592-1990, IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Insulated Connectors, provides design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.