Detection Limit and Sensitivity in PIXE Analysis of Thick Samples

Proton induced x-ray emission (PIXE) is a well established tool in trace element analysis of thin samples. Energy loss, self-absorption and reexcitation, however, present serious problems for trace element analysis of thick samples. For a systematic study thick samples have been produced on the basis of synthetic glass with 3 to 5 different lanthanoids of various concentrations. The dependence of detection limit and sensitivity on such parameters as concentration or combination of elements has been investigated. A comparison is given of x-ray spectrometry in different methods (PIXE, scanning electron microscope, electron microprobe).