Analog Modeling Improves Test Programs

The complexity of integrated circuits has increased to the point that the integrated circuit's (IC) internal circuit components affect the ability of in-circuit testers to accurately measure analog components connected externally to the IC. For analog circuit analyzers, the ability to describe the IC's internal electrical equivalent using standard components, R, L, C, etc., improves the automatic analog test program generator's ability to add guards to offset the internal shunts. This article presents a technique for selecting and describing basic component types and component magnitudes within the IC's internal structure.