Measurement of Dielectric Loss Using a Cut-Off Circular Waveguide Cavity

Based on a resonant cavity technique used by Hanfling and Botte, this paper describes an extension of their method for the determination of the loss tangent of dielectric materials by means of Q-factor measurements. The present method appears to be suitable for materials of low loss (tan δ < 0.001). Measurements made on Teflon samples using a modified copper cavity designed for the X-band are reported.