A New Method of Measuring Dielectric Property of Very-High-Loss Materials at High Frequencies

This paper presents a circuit system functioning as a capacitance meter suitable for very-high-loss material with a wide range of application in various fields of scientific research and industrial operation. The minimum equivalent parallel resistance of the specimen to be measured reaches as low as 50 ohms and the measuring range of capacitance is from about 0.1 ~ 1000 pF at 2 MHz. Some experimental data are given for the appreciation of its characteristics.