An Investigation of the Shielding Performance of PCB-level Enclosures using a Reverberation Chamber

PCB-level shielding enclosures differ from the other shielding products in several aspects due to their small volume and therefore pose new challenges to the evaluation of performance. This paper describes several possible approaches, and issues about using a reverberation chamber to accomplish a fast and reliable measurement. The interaction between the internal source and the enclosure is also investigated. In addition, the performance of the enclosure in isolating near-field interference in a high-Q environment, which is general in practical applications, is compared with the measurement result from the proposed reverberation chamber method. An approach is also introduced to indicate the impact of changing environment to the near-field coupling.