Electromagnetic Field Distribution Measurements Using an Optically Scanning Probe System

An optically scanning electromagnetic field probe system, consisting of an electro-optic or magneto-optic crystal substrate and a galvano scanner, has been developed for high speed, low-invasive measurement of electromagnetic field distribution. We present some examples of measurement of electric field distributions using a LiNbO
₃
crystal substrate and the probe system. We have also measured magnetic field distributions above an MSL using a magnetic garnet thin film in the gigahertz range.