In-Situ, Real-Time Detector for Faults in Solder Joint Networks of Operational, Fully-Programmed Field Programmable Gate Arrays (FPGAs)

Introduced is an innovative, in-situ solder-joint built-in self-test (SJ BIST™) to detect high-resistance damage to solder-joint networks of fully operational field programmable gate arrays (FPGAs) in ball-grid array (BGA) packages such as a XILINX® FG1152/FG1156. FPGAs are used in all manner and kinds of control systems in both defense and commercial applications.