Composite local-linear state-space models for the behavioral modeling of digital devices

This paper discusses the generation of accurate and efficient behavioral models of digital ICs for the assessment of signal integrity effects in high-performance electronics systems. The proposed approach is based on the estimation of composite local-linear state-space models either from simulated or measured device port responses. These representations help to overcome some limitations of traditional parametric relations used so far and the obtained models are readily implemented in any simulation tool as SPICE subcircuits or VHDL-AMS hardware descriptions. The application of the advocated approach to the modeling of a real device exhibiting a strong nonlinear behavior and high order dynamical effects concludes the contribution.