Study on Space Morphology of Molecular Structure by AFM

The study on small molecular space morphology of nanometer material by a high-resolution Atomic Force Microscopy (AFM) is introduced in this paper. The high-resolution AFM.IPC-208B was developed by Chongqing University, and its precision: lateral resolution is 0.1 nm, vertical resolution is 0.01 nm. Applying AFM.IPC-208B, we obtained the surface structures of five samples (natural white mica, polyimide, ZnO and thin films of CdIn
₂
O
₄
, V
₂
O
₅
). Through observing, the surface three-dimensional images are reconstructed, meanwhile corresponding molecular structures and structural parameters are analyzed and obtained. The scanning area to every sample is only 5-10 nm. The obtained results on molecular structure of the five materials by AFM.IPC-208B have never been seen in overseas or home reports