Nanostructured Materials Studied by Means of the Computed Field Ion Image Tomography (CFIIT)

A new technique for transmission electron microscopy and atom probe tomography of nanocrystalline materials is developed based on field ion microscopy (FIM). The computed field ion image tomography (cFIIT) uses stacked field ion micrographs to reconstruct volumes 10
²
to 10
³
times larger than those from tomographic atom probe. This method also makes it possible to create "virtual" FIM images in order to visualise nanoscopic microstructures and provides orientation information to obtain the distances between grain boundary precipitates