Abstract:
With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. ...Show MoreMetadata
Abstract:
With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach.
Published in: 35th ARFTG Conference Digest
Date of Conference: 10-11 May 1990
Date Added to IEEE Xplore: 12 March 2007
ISBN Information:
