Automated XML-based Test Modelling For Mixed-Signal Circuits

Automated system-level test model approach is introduced, incorporating XML, while making use of interchangeable virtual instruments (IVI) and automatic test markup language (ATML) standards. Integrating basic block models into an automated test framework, targeting specifically mixed-signal ICs, the focus is on abstraction through integrating proven technologies in growing complexity levels. Initial result shows high potential for parallel development of system-level design and test models, thus reducing total production time