Compact Modeling of High Frequency Correlated Noise in HBTs

A compact model solution, consistent with the system theory for correlated base and collector shot noise sources, is derived and implemented in the bipolar transistor model HICUM using Verilog-A. Compiled (with Tiburon) Verilog-A model is simulated using ADS 2004A and the results are tested against measured noise parameters for high-frequency (f
_T
at 150 GHz) SiGe HBTs. Very good agreement between simulated and measured data is obtained