Stability diagnosis of microwave recursive structures using the NDF methodology

In this paper, we verify and validate the new important concepts developed by W. Struble and A. Platzkerin (see IEEE GaAs IC Symp. Dig., p. 251-4, 1993) by comparing the NDF method to-classical-low frequency concepts which, under some assumptions, can be applied to microwave recursive structures. We proceed with the examples of a first-order and a second-order recursive filters and show how the NDF expression for this kind of filter can be easily identified.<
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