A Metric for the Quantification of Memory Effects in Power Amplifiers

This paper presents a quantitative metric for memory effects in power amplifiers (PAs) and applies it to various active device technologies and wireless system contexts. The proposed metric is mathematically founded in the dynamic two-tone distortion response, has a clear physical meaning in the important field of PA linearization and can be easily evaluated from either harmonic balance simulations or measurement data gathered in a microwave laboratory. In addition, a memoryless PA linearizer, optimum for reducing the integrated intermodulation distortion (IMD) power in the operation bandwidth for a two-tone excitation, is derived, providing a rigorous figure-of-merit of PA linearizability under static IMD compensation. The application of this figure-of-merit is then illustrated for three different PA prototypes based on Si LDMOS, InGaP/GaAs heterojunction bipolar transistors, and GaN high electron-mobility transistors, designed for 900-MHz (global system for mobile communications), 2.1-GHz (wideband code division multiple access), and 3.5-GHz (WiMax) wireless systems, respectively.